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纳米压痕仪
Nano Indenter G200

型 号:Nano Indenter G200生产厂家:美国Agilent公司主要配置:Standard Indentation head assemblyDCM head assembly (DCM组元)Lateral Force Measurement (水平力测量组元)Nano VisionTM Nanomechanical Microscope Option(纳米观察纳米力学显微镜〕Continuous Stiffness Measurement (CSM)(连续刚度测量组元:CSM技术)压针类型1. Berkovich diamond tip, tip radius 20 nm2. Cube Corner diamond tip,tip radius 20nm3.Conical Diamond Tip, 90 degree angle, 5 micron radius4.Diamond Wedge Tip R<200nm 45 Degree 50micronsContinuous Stiffness Measurement (CSM)(连续刚度测量组元:CSM技术)压针类型1. Berkovich diamond tip, tip radius 20 nm2. Cube Corner diamond tip,tip radius 20nm3.Conical Diamond Tip, 90 degree angle, 5 micron radius4.Diamond Wedge Tip R<200nm 45="" degree="" standard="" indentation="" head="" assemblytotal="" indenter="" 1.5mmmaximum="" mmaximum="" load="" 500mnmaximum="" with="" high="" 10nload="" 50nnload="" f...